Characterization of Si Nanocrystals Embedded in SiO2 Matrix by Atom Probe Tomography

B. Han (1) , Yasuo Shimizu (2) , Gabriele Seguini (3) , Elisa Arduca (3) , Celia Castro (4) , Gérard Benassayag (5, 4) , Koji Inoue (1) , Yasuyochi Nagai (1) , Sylvie Schamm-Chardon (4, 5) , Michele Perego (3)

1 Tohoku University [Sendai]
2 WPI-AIMR - WPI Advanced Institute for Materials Research
3 IMM-CNR - Laboratorio MDM
4 CEMES-MEM - Matériaux et dispositifs pour l'Electronique et le Magnétisme
5 CEMES - Centre d'élaboration de matériaux et d'études structurales

Domaines: Science des matériaux [cond-mat.mtrl-sci]; Physique [physics]

B. Han, Yasuo Shimizu, Gabriele Seguini, Elisa Arduca, Celia Castro, et al.. Characterization of Si Nanocrystals Embedded in SiO2 Matrix by Atom Probe Tomography. EMN Meeting on Nanocrystals, Oct 2016, Xi'an, China. ⟨hal-02082375⟩