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Characterization of Si Nanocrystals Embedded in SiO2 Matrix by Atom Probe Tomography

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https://hal.archives-ouvertes.fr/hal-02082375
Contributor : Sylvie Schamm-Chardon <>
Submitted on : Thursday, March 28, 2019 - 11:16:59 AM
Last modification on : Friday, January 10, 2020 - 9:10:21 PM

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  • HAL Id : hal-02082375, version 1

Citation

B. Han, Yasuo Shimizu, Gabriele Seguini, Elisa Arduca, Celia Castro, et al.. Characterization of Si Nanocrystals Embedded in SiO2 Matrix by Atom Probe Tomography. EMN Meeting on Nanocrystals, Oct 2016, Xi'an, China. ⟨hal-02082375⟩

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