Development of Niobium Nitride based Highly Sensitive Resistive Probes for Nanoscale Scanning Thermal Microscopy - Archive ouverte HAL Accéder directement au contenu
Poster De Conférence Année : 2018
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hal-02025433 , version 1 (19-02-2019)

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  • HAL Id : hal-02025433 , version 1

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Rahul Swami, Gwénäelle Julié, Simon Ledenmat, Jean-François Motte, Ali Alkurdi, et al.. Development of Niobium Nitride based Highly Sensitive Resistive Probes for Nanoscale Scanning Thermal Microscopy. Eurotherm 111: Nanoscale and Microscale Heat Transfer VI, Dec 2018, Levi, Finland. ⟨hal-02025433⟩
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