Experimental Demonstration of Operational Z 2 -FET Memory Matrix - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue IEEE Electron Device Letters Année : 2018

Experimental Demonstration of Operational Z 2 -FET Memory Matrix

Résumé

In this letter, a functional Z 2 -FET DRAM memory matrix is experimentally demonstrated for the first time. Word-level operation with simultaneous reading and programming accesses is successfully proved. Disturbance is also explored, and the results demonstrate bitline disturbance immunity. Furthermore, the fabricated memory matrix, which includes only one selector per word-line, facilitates the scalability of the memory for increasing array dimensions.

Dates et versions

hal-02006998 , version 1 (05-02-2019)

Identifiants

Citer

Santiago Navarro, Carlos Marquez, Hassan El Dirani, Philippe Galy, Maryline Bawedin, et al.. Experimental Demonstration of Operational Z 2 -FET Memory Matrix. IEEE Electron Device Letters, 2018, 39 (5), pp.660-663. ⟨10.1109/LED.2018.2819801⟩. ⟨hal-02006998⟩
20 Consultations
0 Téléchargements

Altmetric

Partager

Gmail Facebook X LinkedIn More