Skip to Main content Skip to Navigation
New interface
Conference papers

Numerical Simulations for Sensitivity Analysis of the Electrostatic Force Curve on Charge Localization in 3D

Abstract : In the present work we present a model for Atomic Force Microscopy (AFM) tip interacting electrostatically with a thin dielectric layer. Numerical simulations enabled us to estimate the electrostatic force induced by a half-ellipsoid charge distribution. The sensitivity of the shape of the Electrostatic Force Distance Curves (EFDC) to charge localization is investigated for the charge parameters as radius, depth and density of charges.
Document type :
Conference papers
Complete list of metadata

https://hal.archives-ouvertes.fr/hal-02005747
Contributor : Nicolas Binaud Connect in order to contact the contributor
Submitted on : Monday, January 11, 2021 - 1:50:50 PM
Last modification on : Tuesday, October 25, 2022 - 11:58:11 AM
Long-term archiving on: : Monday, April 12, 2021 - 6:55:06 PM

File

AzibICD327-hal.pdf
Files produced by the author(s)

Identifiers

Citation

Menouar Azib, Fulbert Baudoin, Christina Villeneuve-Faure, G. Teyssedre, Nicolas Binaud, et al.. Numerical Simulations for Sensitivity Analysis of the Electrostatic Force Curve on Charge Localization in 3D. 2018 IEEE 2nd International Conference on Dielectrics (ICD), Jul 2018, Budapest, Hungary. pp.1-4, ⟨10.1109/ICD.2018.8514685⟩. ⟨hal-02005747⟩

Share

Metrics

Record views

76

Files downloads

70