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Impact of a Laser Pulse on a STT-MRAM Bitcell: Security and Reliability Issues

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https://hal.archives-ouvertes.fr/hal-01976697
Contributor : Guillaume Prenat <>
Submitted on : Thursday, January 10, 2019 - 11:27:29 AM
Last modification on : Monday, March 29, 2021 - 3:08:09 PM

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M. Kharbouche-Harrari, J. Postel-Pellerin, G. Di Pendina, R. Wacquez, D. Aboulkassimi, et al.. Impact of a Laser Pulse on a STT-MRAM Bitcell: Security and Reliability Issues. 2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS), Jul 2018, Platja d'Aro, Spain. ⟨10.1109/IOLTS.2018.8474088.⟩. ⟨hal-01976697⟩

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