Characterization of advanced ALD-based thin film barriers for organic electronics using ToF-SIMS analysis

Tanguy Terlier 1, 2 Tony Maindron 1 Jean-Paul Barnes 1, * Didier Léonard 2
* Corresponding author
2 Surfaces
ISA - Institut des Sciences Analytiques
Document type :
Journal articles
Complete list of metadatas

https://hal.archives-ouvertes.fr/hal-01963177
Contributor : Agnès Bussy <>
Submitted on : Friday, December 21, 2018 - 11:01:04 AM
Last modification on : Sunday, December 23, 2018 - 1:22:06 AM

Identifiers

Collections

Citation

Tanguy Terlier, Tony Maindron, Jean-Paul Barnes, Didier Léonard. Characterization of advanced ALD-based thin film barriers for organic electronics using ToF-SIMS analysis. Organic Electronics, Elsevier, 2018, 59, pp.21-26. ⟨10.1016/j.orgel.2018.04.031⟩. ⟨hal-01963177⟩

Share

Metrics

Record views

30