Coherent X-ray diffraction imaging meets ptychography to study core-shell-shell nanowires

A. Davtyan (1) , V. Favre-Nicolin (2) , R. Lewis (3) , H. Küpers (3) , L. Geelhaar (3) , D. Kriegner (4) , D. Bahrami (1) , A. Al-Hassan (1) , G. Chahine (2, 5) , O. Loffeld (1) , U. Pietsch (6)

1 University of Siegen
2 ESRF - European Synchrotron Radiation Facility
3 PDI - Paul-Drude-Institut für Festkörperelektronik
4 Institute of Physics [Prague]
5 SIMaP - Science et Ingénierie des Matériaux et Procédés
6 Univ Siegen, Dept Phys, D-57072 Siegen, Germany

Domaines: Science des matériaux [cond-mat.mtrl-sci]

A. Davtyan, V. Favre-Nicolin, R. Lewis, H. Küpers, L. Geelhaar, et al.. Coherent X-ray diffraction imaging meets ptychography to study core-shell-shell nanowires. MRS Advances, 2018, 3 (39), pp.2317-2322. ⟨10.1557/adv.2018.466⟩. ⟨hal-01958503⟩