In Situ Coherent X-ray Diffraction during Three-Point Bending of a Au Nanowire: Visualization and Quantification

Anton Davydok (1) , Thomas W. Cornelius (2) , Zhe Ren (3) , Cédric Leclere (4) , Gilbert Chahine , Tobias Schülli (5) , Florian Lauraux , Günther H.S. Richter (6) , Olivier Thomas

1 Structure and Nano-/Micromechanics Materials Department
2 IM2NP - Institut des Matériaux, de Microélectronique et des Nanosciences de Provence
3 Univ Geneva, DQMP, 24 Quai Ernest, CH-1211 Geneva 4, Switzerland
4 LMGP - Laboratoire des matériaux et du génie physique
5 ESRF - European Synchrotron Radiation Facility
6 Max Planck Institute for Intelligent Systems [Tübingen]

The three-point bending behavior of a single Au nanowire deformed by an atomic force microscope was monitored by coherent X-ray diffraction using a sub-micrometer sized hard X-ray beam. Three-dimensional reciprocal-space maps were recorded before and after deformation by standard rocking curves and were measured by scanning the energy of the incident X-ray beam during deformation at different loading stages. The mechanical behavior of the nanowire was visualized in reciprocal space and a complex deformation mechanism is described. In addition to the expected bending of the nanowire, torsion was detected. Bending and torsion angles were quantified from the high-resolution diffraction data.

Mots clés: nanomechanics; nanostructures; synchrotron X-ray diffraction

Domaines: Mécanique des solides [physics.class-ph]; Micro et nanotechnologies/Microélectronique

Anton Davydok, Thomas W. Cornelius, Zhe Ren, Cédric Leclere, Gilbert Chahine, et al.. In Situ Coherent X-ray Diffraction during Three-Point Bending of a Au Nanowire: Visualization and Quantification. Quantum Beam Science, 2018, 2 (4), ⟨10.3390/qubs2040024⟩. ⟨hal-01937007⟩