A new methodology for EMC prediction of integrated circuits after aging

Abstract : EMC of integrated circuits represents a major constraint for the qualification of electronic circuits. Today, there are existing standardized models such as ICEM-CE that allows the prediction of conducted emission generated by an IC at a PCB level. However, the EMC levels may change after a certain period of operation due to the aging of components. On the other hand, no existing model or tool can predict the long-term EMC levels. This paper presents a new methodology for modeling of integrated circuits in order to construct an EMC model which takes into account the aging based on a new reliability model called M-STORM.
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Chaimae Ghfiri, Alexandre Boyer, Alain Bensoussan, André Durier, Sonia Ben Dhia. A new methodology for EMC prediction of integrated circuits after aging. IEEE Transactions on Electromagnetic Compatibility, Institute of Electrical and Electronics Engineers, 2019, 61 (2), pp.572-581. ⟨10.1109/TEMC.2018.2819722⟩. ⟨hal-01951615⟩



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