Ultra wide range measurement of the spectral properties of thin-film filters: Specular and scattered light metrology

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https://hal.archives-ouvertes.fr/hal-01933137
Contributor : Myriam Zerrad <>
Submitted on : Friday, November 23, 2018 - 3:23:57 PM
Last modification on : Monday, March 4, 2019 - 2:04:24 PM

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  • HAL Id : hal-01933137, version 1

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Myriam Zerrad, Simona Liukaityte, Michel Lequime, Claude Amra. Ultra wide range measurement of the spectral properties of thin-film filters: Specular and scattered light metrology. ”, Frontiers of Optical Coatings, Oct 2017, Canton, China. ⟨hal-01933137⟩

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