Investigation of the properties of nanostructured nickel oxide NiO thin films irradiated at different γ-doses - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue Journal of Materials Science: Materials in Electronics Année : 2019
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hal-02939434 , version 1 (15-09-2020)

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Faycal Chandoul, Hatem Moussa, Karima Jouini, Abdelwaheb Boukhachem, Faouzi Hosni, et al.. Investigation of the properties of nanostructured nickel oxide NiO thin films irradiated at different γ-doses. Journal of Materials Science: Materials in Electronics, 2019, 30 (1), pp.348-358. ⟨10.1007/s10854-018-0299-z⟩. ⟨hal-02939434⟩
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