Speckles and DIC or Checkerboards and LSA?
Résumé
Two measurement techniques, namely DIC and LSA, are compared in this study. Both techniques consist in minimizing the optical residual. DIC performs the minimization in the real domain on speckles. LSA performs this minimization in the Fourier domain on periodic patterns such as checkerboards. It is shown here that for the same systematic error and the same spatial resolution, the noise level in displacement and strain maps is lower with LSA than with DIC.