A physical approach on SCOBIC investigation in VLSI

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https://hal.archives-ouvertes.fr/hal-01887645
Contributor : Vincent Pouget <>
Submitted on : Thursday, October 4, 2018 - 12:02:59 PM
Last modification on : Friday, October 5, 2018 - 1:16:34 AM

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T. Beauchêne, D. Lewis, F. Beaudoin, V. Pouget, P. Perdu, et al.. A physical approach on SCOBIC investigation in VLSI. Microelectronics Reliability, Elsevier, 2003, 43 (1), pp.173 - 177. ⟨10.1016/S0026-2714(02)00282-2⟩. ⟨hal-01887645⟩

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