Dramatic effect of thermal expansion mismatch on the structural, dielectric, ferroelectric and pyroelectric properties of low-cost epitaxial PZT films on SrTiO 3 and Si (001) subtrates.
Résumé
Because of different thermal expansion mismatches between the film and the substrate, either mainly c-oriented or a-oriented tetragonal epitaxial PZT layers are obtained on SrTiO3 or Si (001) substrates, respectively. The resulting large differences in the dielectric, ferroelectric and pyroelectric properties are measured along the out-of-plane direction.
Origine : Fichiers produits par l'(les) auteur(s)
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