A Generalized Differential Colorimetric Interferometry Method: Extension to the Film Thickness Measurement of Any Point Contact Geometry

David Wheeler (1) , Jérôme Molimard (2) , Nicolas Devaux (1) , David Philippon (1) , Nicolas Fillot (1) , Philippe Vergne (1) , Guillermo Morales-Espejel (3, 4)

1 TMI - Tribologie et Mécanique des Interfaces
2 CIS-ENSMSE - Centre Ingénierie et Santé
3 LaMCoS - Laboratoire de Mécanique des Contacts et des Structures [Villeurbanne]
4 SKF-ERC - SKF Engineeing and Research Centre

Domaines: Autre

David Wheeler, Jérôme Molimard, Nicolas Devaux, David Philippon, Nicolas Fillot, et al.. A Generalized Differential Colorimetric Interferometry Method: Extension to the Film Thickness Measurement of Any Point Contact Geometry. Tribology Transactions, 2018, 61 (4), pp.648 - 660. ⟨10.1080/10402004.2017.1386809⟩. ⟨hal-01832680⟩