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Journal articles
Numerical simulations for quantitative analysis of electrostatic interaction between atomic force microscopy probe and an embedded electrode within a thin dielectric: meshing optimization, sensitivity to potential distribution and impact of cantilever contribution
https://hal.archives-ouvertes.fr/hal-01826031
Contributor : Florian Bugarin <>
Submitted on : Tuesday, November 24, 2020 - 5:53:29 PM
Last modification on : Tuesday, December 8, 2020 - 4:24:21 PM
Long-term archiving on: : Thursday, February 25, 2021 - 9:00:20 PM
Contributor : Florian Bugarin <>
Submitted on : Tuesday, November 24, 2020 - 5:53:29 PM
Last modification on : Tuesday, December 8, 2020 - 4:24:21 PM
Long-term archiving on: : Thursday, February 25, 2021 - 9:00:20 PM
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