Numerical simulations for quantitative analysis of electrostatic interaction between atomic force microscopy probe and an embedded electrode within a thin dielectric: meshing optimization, sensitivity to potential distribution and impact of cantilever contribution

M Azib; Fulbert Baudoin; Nicolas Binaud; F Villeneuve-Faure; Florian Bugarin; Stéphane Segonds; G. Teyssedre

Numerical simulations for quantitative analysis of electrostatic interaction between atomic force microscopy probe and an embedded electrode within a thin dielectric: meshing optimization, sensitivity to potential distribution and impact of cantilever contribution

M Azib ^{1, 2} Fulbert Baudoin ¹ Nicolas Binaud ² F Villeneuve-Faure ¹ Florian Bugarin ² Stéphane Segonds ² G. Teyssedre ¹

1 LAPLACE - LAboratoire PLasma et Conversion d'Energie

2 ICA - Institut Clément Ader

Document type :

Journal articles

Domain :

Mathematics [math] / Optimization and Control [math.OC]

Engineering Sciences [physics] / Signal and Image processing

Computer Science [cs] / Robotics [cs.RO]

Complete list of metadatas

https://hal.archives-ouvertes.fr/hal-01826031
Contributor : Florian Bugarin <>
Submitted on : Thursday, June 28, 2018 - 10:08:47 PM
Last modification on : Friday, June 14, 2019 - 6:31:19 PM

Numerical simulations for quantitative analysis of electrostatic interaction between atomic force microscopy probe and an embedded electrode within a thin dielectric: meshing optimization, sensitivity to potential distribution and impact of cantilever contribution

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Numerical simulations for quantitative analysis of electrostatic interaction between atomic force microscopy probe and an embedded electrode within a thin dielectric: meshing optimization, sensitivity to potential distribution and impact of cantilever contribution

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