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Communication Dans Un Congrès Année : 2010

4D CHARACTERIZATION OF METALS BY 3DXRD

Résumé

The status of 3DXRD microscopy is reviewed, with a special view to applications in metallurgy. Various approaches are compared in terms of perfounance. In addition several recent advances are presented, such as a 3D grain map with an unprecedented spatial resolution of 500 nm, first results from the commissioning of a novel 3D detector set-up and a validation of the box-scan procedure.

Domaines

Matériaux
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Dates et versions

hal-01822657 , version 1 (25-06-2018)

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  • HAL Id : hal-01822657 , version 1

Citer

H. F. Poulsen, Wolfgang Ludwig, E. M. Lauridsen, S. Schmidt, W. Pantleon, et al.. 4D CHARACTERIZATION OF METALS BY 3DXRD. CHALLENGES IN MATERIALS SCIENCE AND POSSIBILITIES IN 3D AND 4D CHARACTERIZATION TECHNIQUES, 2010, POSTBOX 49, DK-4000 ROSKILDE, Denmark. pp.101-119. ⟨hal-01822657⟩
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