Curved sensors for compact high-resolution wide field designs: prototype demonstration and optical characterization

Bertrand Chambion (1) , Christophe Gaschet (2, 1) , Thibault Behaghel (2) , Aurélie Vandeneynde (1) , Stéphane Caplet (1) , Stéphane Gétin (1) , David Henry (1) , Emmanuel Hugot (2) , Wilfried Jahn (2, 3) , Simona Lombardo (2) , Marc Ferrari (2)

1 CEA-LETI - Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information
2 LAM - Laboratoire d'Astrophysique de Marseille
3 Caltech Division of Engineering and Applied Science

Over the recent years, a huge interest has grown for curved electronics, particularly for opto-electronics systems. Curved sensors help the correction of off-axis aberrations, such as Petzval Field Curvature, astigmatism, and bring significant optical and size benefits for imaging systems. In this paper, we first describe advantages of curved sensor and associated packaging process applied on a 1/1.8'' format 1.3Mpx global shutter CMOS sensor (Teledyne EV76C560) into its standard ceramic package with a spherical radius of curvature Rc=65mm and 55mm. The mechanical limits of the die are discussed (Finite Element Modelling and experimental), and electro-optical performances are investigated. Then, based on the monocentric optical architecture, we proposed a new design, compact and with a high resolution, developed specifically for a curved image sensor including optical optimization, tolerances, assembly and optical tests. Finally, a functional prototype is presented through a benchmark approach and compared to an existing standard optical system with same performances and a x2.5 reduction of length. The finality of this work was a functional prototype demonstration on the CEA-LETI during Photonics West 2018 conference. All these experiments and optical results demonstrate the feasibility and high performances of systems with curved sensors.

Mots clés: Curved sensors; Detectors; Arrays; Imaging systems; Optical design; Petzval Field Curvature; High resolution; Compact; Photography; Mechanical limits; Aberrations; Field of view; Electro-optical characterization

Domaines: Optique / photonique; Electronique; Micro et nanotechnologies/Microélectronique

Bertrand Chambion, Christophe Gaschet, Thibault Behaghel, Aurélie Vandeneynde, Stéphane Caplet, et al.. Curved sensors for compact high-resolution wide field designs: prototype demonstration and optical characterization. SPIE Photonics West 2018, Jan 2018, San Francisco, United States. ⟨hal-01796109⟩