3-D electrothermal simulation of active cycling on smart power MOSFETs during short-circuit and UIS conditions

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https://hal.archives-ouvertes.fr/hal-01700449
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Submitted on : Sunday, February 4, 2018 - 3:56:50 PM
Last modification on : Thursday, February 7, 2019 - 5:04:13 PM

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Michele Riccio, Vincenzo D’alessandro, Andrea Irace, Gilles Rostaing, Mounira Berkani, et al.. 3-D electrothermal simulation of active cycling on smart power MOSFETs during short-circuit and UIS conditions. Microelectronics Reliability, Elsevier, 2014, 54 (9-10), pp.1845 - 1850. ⟨10.1016/j.microrel.2014.08.011⟩. ⟨hal-01700449⟩

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