Bi-color near infrared thermoreflectometry: A method for true temperature field measurement

Abstract : In a context of radiative temperature field measurement, this paper deals with an innovative method, called bicolor near infrared thermoreflectometry, for the measurement of true temperature fields without prior knowledge of the emissivity field of an opaque material. This method is achieved by a simultaneous measurement, in the near infrared spectral band, of the radiance temperature fields and of the emissivity fields measured indirectly by reflectometry. The theoretical framework of the method is introduced and the principle of the measurements at two wavelengths is detailed. The crucial features of the indirect measurement of emissivity are the measurement of bidirectional reflectivities in a single direction and the introduction of an unknown variable, called the ``diffusion factor.'' Radiance temperature and bidirectional reflectivities are then merged into a bichromatic system based on Kirchhoff's laws. The assumption of the system, based on the invariance of the diffusion factor for two near wavelengths, and the value of the chosen wavelengths, are then discussed in relation to a database of several material properties. A thermoreflectometer prototype was developed, dimensioned, and evaluated. Experiments were carried out to outline its trueness in challenging cases. First, experiments were performed on a metallic sample with a high emissivity value. The bidirectional reflectivity was then measured from low signals. The results on erbium oxide demonstrate the power of the method with materials with high emissivity variations in near infrared spectral band.
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https://hal.archives-ouvertes.fr/hal-01687322
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Submitted on : Thursday, January 18, 2018 - 12:41:26 PM
Last modification on : Friday, June 14, 2019 - 6:31:17 PM

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Thierry Sentenac, Rémi Gilblas, Daniel Hernandez, Yannick Le Maoult. Bi-color near infrared thermoreflectometry: A method for true temperature field measurement. Review of Scientific Instruments, American Institute of Physics, 2012, 83 (12), ⟨10.1063/1.4769802⟩. ⟨hal-01687322⟩

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