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Adaptive Test Flow for Mixed-Signal ICs

Abstract : Adaptive test is a promising direction for reducing the manufacturing test cost. It aims to dynamically adjust the test program on a device-by-device or on a wafer-by-wafer basis. Adjusting the test program could involve eliminating tests, changing test limits, re-ordering tests, etc. The objective is to spend the minimum possible test time per device without sacrificing fault coverage. In this paper, we present an adaptive test flow for mixed-signal ICs and we demonstrate its effectiveness on a sizable production dataset from a large mixed-signal IC. The adaptive test flow first eliminates seemingly redundant tests on a wafer-by-wafer basis and then it may refine the test content on a device-by-device basis so as to ensure high fault coverage. In addition, it estimates the test escape risk so as to provide confidence in the binning of devices.
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Contributor : Haralampos Stratigopoulos <>
Submitted on : Wednesday, December 20, 2017 - 6:37:16 PM
Last modification on : Thursday, March 21, 2019 - 2:30:22 PM



Haralampos-G. Stratigopoulos, Christian Streitwieser. Adaptive Test Flow for Mixed-Signal ICs. IEEE 35th VLSI Test Symposium, Apr 2017, Las Vegas, United States. pp.1-6, ⟨10.1109/VTS.2017.7928919⟩. ⟨hal-01669360⟩



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