Adaptive Test Flow for Mixed-Signal ICs

Abstract : Adaptive test is a promising direction for reducing the manufacturing test cost. It aims to dynamically adjust the test program on a device-by-device or on a wafer-by-wafer basis. Adjusting the test program could involve eliminating tests, changing test limits, re-ordering tests, etc. The objective is to spend the minimum possible test time per device without sacrificing fault coverage. In this paper, we present an adaptive test flow for mixed-signal ICs and we demonstrate its effectiveness on a sizable production dataset from a large mixed-signal IC. The adaptive test flow first eliminates seemingly redundant tests on a wafer-by-wafer basis and then it may refine the test content on a device-by-device basis so as to ensure high fault coverage. In addition, it estimates the test escape risk so as to provide confidence in the binning of devices.
Complete list of metadatas

https://hal.archives-ouvertes.fr/hal-01669360
Contributor : Haralampos Stratigopoulos <>
Submitted on : Wednesday, December 20, 2017 - 6:37:16 PM
Last modification on : Thursday, March 21, 2019 - 2:30:22 PM

Identifiers

Citation

Haralampos-G. Stratigopoulos, Christian Streitwieser. Adaptive Test Flow for Mixed-Signal ICs. IEEE 35th VLSI Test Symposium, Apr 2017, Las Vegas, United States. pp.1-6, ⟨10.1109/VTS.2017.7928919⟩. ⟨hal-01669360⟩

Share

Metrics

Record views

83