Frequency analysis of the penetration depth of the heat flow in SiGe HBTs

d'Esposito Rosario (1) , Sébastien Fregonese (1) , Balanethiram Suresh (1, 2) , Thomas Zimmer (1)

1 IMS - Laboratoire de l'intégration, du matériau au système
2 IIT Madras - Indian Institute of Technology Madras

Domaines: Micro et nanotechnologies/Microélectronique

d'Esposito Rosario, Sébastien Fregonese, Balanethiram Suresh, Thomas Zimmer. Frequency analysis of the penetration depth of the heat flow in SiGe HBTs. 2017. ⟨hal-01649953⟩