Nanoscale Investigation of Carrier Lifetime on the Cross Section of Epitaxial Silicon Solar Cells Using Kelvin Probe Force Microscopy - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue IEEE Journal of Photovoltaics Année : 2016

Nanoscale Investigation of Carrier Lifetime on the Cross Section of Epitaxial Silicon Solar Cells Using Kelvin Probe Force Microscopy

Fichier non déposé

Dates et versions

hal-01640059 , version 1 (20-11-2017)

Identifiants

Citer

Paul Narchi, Romain Cariou, Martin Foldyna, Patricia Prodhomme, Pere Roca I Cabarrocas. Nanoscale Investigation of Carrier Lifetime on the Cross Section of Epitaxial Silicon Solar Cells Using Kelvin Probe Force Microscopy. IEEE Journal of Photovoltaics, 2016, 6 (6), pp.1576 - 1580. ⟨10.1109/JPHOTOV.2016.2598258⟩. ⟨hal-01640059⟩
271 Consultations
0 Téléchargements

Altmetric

Partager

Gmail Facebook X LinkedIn More