Analysis of X-Ray Photo-Charge Induced Speckles in a Radiation Hardened CMOS Image Sensor

Timothé Allanche (1) , Vincent Goiffon (2) , Serena Rizzolo (2) , Philippe Paillet (3) , Aziouz Chabane (2) , Olivier Duhamel (3) , Cyprien Muller (1) , Pierre Magnan (2) , Raphael Clerc (1) , Emmanuel Marin (1) , Aziz Boukenter (1) , Youcef Ouerdane (1) , Sylvain Girard (1)

1 LHC - Laboratoire Hubert Curien
2 DEOS - Département Electronique, Optronique et Signal
3 DAM/DIF - DAM Île-de-France

Domaines: Optique / photonique

Timothé Allanche, Vincent Goiffon, Serena Rizzolo, Philippe Paillet, Aziouz Chabane, et al.. Analysis of X-Ray Photo-Charge Induced Speckles in a Radiation Hardened CMOS Image Sensor. RADECS 2017 : Radiation and Its Effects on Components and Systems, Oct 2017, Genève, Switzerland. ⟨hal-01621096⟩