Allocation for Testability in High-Level Synthesis Process

Peter Bukovjan (1) , Meryem Marzouki (1) , Walid Maroufi (1)

1 ASIM - Architecture des Systèmes intégrés et Micro électronique

This paper focuses on the allocation for testability process as part of a High-Level Synthesis for Testability system. The allocation for testability is mainly defined as the search for best cost/quality trade-offs between the designer requirements and testability means that can be proposed by the system, considering the available functional units in a library and the possibility to generate additional testability structures.

Domaines: Informatique [cs]

Peter Bukovjan, Meryem Marzouki, Walid Maroufi. Allocation for Testability in High-Level Synthesis Process. 5th Electronic Devices and Systems Conference, Jun 1998, Brno, Czech Republic. ⟨hal-01618367⟩