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Cost/Quality Trade-off in High-Level Synthesis for Testability

Abstract : This paper focuses on the trade-off algorithm, which is a core part of the allocation for testability process of a High-Level Synthesis for Testability system. The allocation for testability is mainly defined as the search for best cost/quality trade-offs between the designer requirements and testability means that can be proposed by the system, considering the available functional units in a library and the possibility to generate additional testability structures. The paper first presents the defined methodology and the considered criteria, and then gives example results.
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Submitted on : Tuesday, October 17, 2017 - 2:14:29 PM
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  • HAL Id : hal-01618075, version 1


Peter Bukovjan, Meryem Marzouki, Walid Maroufi. Cost/Quality Trade-off in High-Level Synthesis for Testability. 2nd International Workshop on Design and Diagnostics of Electronic Circuits and Systems, Sep 1998, Szczyrk, Poland. ⟨hal-01618075⟩



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