Cost/Quality Trade-off in High-Level Synthesis for Testability

Peter Bukovjan (1) , Meryem Marzouki (1) , Walid Maroufi (1)

1 ASIM - Architecture des Systèmes intégrés et Micro électronique

This paper focuses on the trade-off algorithm, which is a core part of the allocation for testability process of a High-Level Synthesis for Testability system. The allocation for testability is mainly defined as the search for best cost/quality trade-offs between the designer requirements and testability means that can be proposed by the system, considering the available functional units in a library and the possibility to generate additional testability structures. The paper first presents the defined methodology and the considered criteria, and then gives example results.

Domaines: Informatique [cs]

Peter Bukovjan, Meryem Marzouki, Walid Maroufi. Cost/Quality Trade-off in High-Level Synthesis for Testability. 2nd International Workshop on Design and Diagnostics of Electronic Circuits and Systems, Sep 1998, Szczyrk, Poland. ⟨hal-01618075⟩