X-ray diffraction contrast tomography: a combined 3D imaging and diffraction methodology for characterization of polycristalline materials
Résumé
X-ray diffraction contrast tomography is a combined synchrotron x-ray imaging and diffraction methodology which enables non-destructive characterization of the 3D microstructure of polycristalline materials at the micrometer length scale. X-ray attenuation and phase contrast reveal the 3D phase microstructure as well as interal defects (porosities, cracks, ...) in the bulk of the material. The simultaneously collected diffraction signals give access to the 3D grain microstructure (3D grain shape, crystallographic orientation and elastic strain). We present recent progress in this field covering instrumental aspects, data acquisition procedures as well as improved data analysis strategies.