Wavefront metrology for coherent hard X-rays by scanning a microsphere

Eirik Torbjorn Bakken Skjonsfjell (1) , Yuriy Chushkin (2) , Federico Zontone (2) , Nilesh Patil (1) , Alain Gibaud (3) , Dag W. Breiby (1, 4)

1 Physics NTNU - Department of Physics [Trondheim]
2 ESRF - European Synchrotron Radiation Facility [Grenoble]
3 IMMM - Institut des Molécules et Matériaux du Mans
4 MNEMS - Micro- and Nanoelectromechanical Systems [University of South-Eastern Norway]

Characterization of the wavefront of an X-ray beam is of primary importance for all applications where coherence plays a major role. Imaging techniques based on numerically retrieving the phase from interference patterns are often relying on an a-priori assumption of the wavefront shape. In Coherent X-ray Diffraction Imaging (CXDI) a planar incoming wave field is often assumed for the inversion of the measured diffraction pattern, which allows retrieving the real space image via simple Fourier transformation. It is therefore important to know how reliable the plane wave approximation is to describe the real wavefront. Here, we demonstrate that the quantitative wavefront shape and flux distribution of an X-ray beam used for CXDI can be measured by using a micrometer size metal-coated polymer sphere serving in a similar way as the hole array in a Hartmann wavefront sensor. The method relies on monitoring the shape and center of the scattered intensity distribution in the far field using a 2D area detector while raster-scanning the microsphere with respect to the incoming beam. The reconstructed X-ray wavefront was found to have a well-defined central region of approximately 16 mu m diameter and a weaker, asymmetric, intensity distribution extending 30 mu m from the beam center. The phase front distortion was primarily spherical with an effective radius of 0.55 m which matches the distance to the last upstream beam-defining slit, and could be accurately represented by Zernike polynomials. (C) 2016 Optical Society of America

Domaines: Optique [physics.optics]

Eirik Torbjorn Bakken Skjonsfjell, Yuriy Chushkin, Federico Zontone, Nilesh Patil, Alain Gibaud, et al.. Wavefront metrology for coherent hard X-rays by scanning a microsphere. Optics Express, 2016, 24 (10), 13 p. ⟨10.1364/OE.24.010710⟩. ⟨hal-01572884⟩