Phase noise characterization of sub-hertz linewidth lasers via digital cross correlation

Xiaopeng Xie 1 Romain Bouchand 1 Daniele Nicolodi 1 Michel Lours 1 Christophe Alexandre 2 Yann Le Coq 1
1 SYRTE - Systèmes de Référence Temps Espace
2 CEDRIC - Centre d'études et de recherche en informatique et communications
Abstract : Phase noise or frequency noise is a key metric to evaluate the short-term stability of a laser. This property is of great interest for the applications but delicate to characterize, especially for narrow linewidth lasers. In this Letter, we demonstrate a digital cross-correlation scheme to characterize the absolute phase noise of sub-hertz linewidth lasers. Three 1542 nm ultra-stable lasers are used in this approach. For each measurement, two lasers act as references to characterize a third one. Phase noise power spectral density from 0.5 Hz to 0.8 MHz Fourier frequencies can be derived for each laser by a mere change in the configuration of the lasers. To the best of our knowledge, this is the first time showing the phase noise of sub-hertz linewidth lasers with no reference limitation. We also present an analysis of the laser phase noise performance.
Keywords : Power spectral density Phase noise Phase measurement High resolution spectroscopy Diode lasers Coherent communications
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Journal articles
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https://hal.archives-ouvertes.fr/hal-01554655
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Submitted on : Monday, July 3, 2017 - 6:09:55 PM
Last modification on : Wednesday, February 19, 2020 - 3:30:49 AM

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Xiaopeng Xie, Romain Bouchand, Daniele Nicolodi, Michel Lours, Christophe Alexandre, et al.. Phase noise characterization of sub-hertz linewidth lasers via digital cross correlation. Opt.Lett., 2017, 42 (7), pp.1217-1220. ⟨10.1364/OL.42.001217⟩. ⟨hal-01554655⟩

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