Thermoreflectance calibration procedure on a laser diode: Application to catastrophic optical facet damage analysis - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue IEEE Electron Device Letters Année : 2005

Thermoreflectance calibration procedure on a laser diode: Application to catastrophic optical facet damage analysis

Résumé

In this letter, we present a thermoreflectance setup specially designed for the study of the temperature variations of the output facet of a laser diode. Indeed, the temperature of the laser diode is controlled by a Peltier element and the device under test is used as a temperature sensor. We propose a calibration procedure based on electrical measurements combined with optical ones; it leads to the determination of thermoreflectance coefficients and then to absolute temperature variations on a running laser diode. We can hence ensure a proper running of the diode and avoid its catastrophic optical facet damage.
Fichier non déposé

Dates et versions

hal-01552734 , version 1 (03-07-2017)

Identifiants

Citer

S. Dilhaire, Stéphane Grauby, W. Claeys. Thermoreflectance calibration procedure on a laser diode: Application to catastrophic optical facet damage analysis. IEEE Electron Device Letters, 2005, 26 (7), pp.461-463. ⟨10.1109/led.2005.851090⟩. ⟨hal-01552734⟩

Collections

CNRS LOMA
36 Consultations
0 Téléchargements

Altmetric

Partager

Gmail Facebook X LinkedIn More