Trade-Offs In Scan Path and BIST Inplementations For RAMS

M. Nicolaidis (1) , O. Kebichi (1) , V. Castro Alves (1)

1 TIMA - Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés

In this article we propose efficient scan path and BIST schemes for RAMs. Tools for automatic generation of these schemes have been implemented. They reduce the design effort and thus allow the designer to select the more appropriate scheme with respect to various constraints.

Domaines: Micro et nanotechnologies/Microélectronique

M. Nicolaidis, O. Kebichi, V. Castro Alves. Trade-Offs In Scan Path and BIST Inplementations For RAMS. Economics of Electronic Design, Manufacture and Test, kluwer academic publishers, pp.147-157, 1970, 978-1-4419-5142-7. ⟨10.1007/978-1-4757-5048-5_14⟩. ⟨hal-01478904⟩