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Novel Wideband Eddy Current Device for the Conductivity Measurement of Semiconductors

Florent Loete 1 yann Le Bihan 1 Denis Mencaraglia 1 
1 GeePs - Laboratoire Génie électrique et électronique de Paris
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https://hal.archives-ouvertes.fr/hal-01465306
Contributor : Yann Le Bihan Connect in order to contact the contributor
Submitted on : Saturday, February 11, 2017 - 4:49:41 PM
Last modification on : Saturday, June 25, 2022 - 10:23:41 PM

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UPMC | CNRS | CENTRALESUPELEC | GEEPS | PHEMADIC | PIEM | UNIV-PARIS-SACLAY | SORBONNE-UNIVERSITE | SU-SCIENCES | GS-ENGINEERING | INSTITUT-SCIENCES-LUMIERE

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Florent Loete, yann Le Bihan, Denis Mencaraglia. Novel Wideband Eddy Current Device for the Conductivity Measurement of Semiconductors. IEEE Sensors Journal, Institute of Electrical and Electronics Engineers, 2016, 16 (11), pp.4151-4152. ⟨10.1109/JSEN.2016.2544403⟩. ⟨hal-01465306⟩

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