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Communication Dans Un Congrès Année : 2016

Application-aware soft error sensitivity evaluation without fault injections - Application to Leon3

Résumé

Design-time evaluations of the sensitivity of circuits with respect to soft errors are usually done by means of fault injection campaigns. Such campaigns are time-consuming, either in order to prepare the hardware set-up (e.g., prototype on emulation platform) or in terms of simulation run. We propose here an approach avoiding any fault injections but able to evaluate the intrinsic sensitivity of the circuit for a given application by leveraging the work done for functional verification. This approach provides worst-case evaluations with good accuracy and no specific investment. The approach is demonstrated on several applications executed on a Leon3 microprocessor.
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Dates et versions

hal-01459834 , version 1 (07-02-2017)

Licence

Paternité - Pas d'utilisation commerciale

Identifiants

  • HAL Id : hal-01459834 , version 1

Citer

K. Chibani, Michele Portolan, Régis Leveugle. Application-aware soft error sensitivity evaluation without fault injections - Application to Leon3. European Conference on Radiation and its Effects on Components and Systems (RADECS'16), Sep 2016, Bremen, Germany. ⟨hal-01459834⟩

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