A Fully-Digital BIST Wrapper Based on Ternary Test Stimuli for the Dynamic Test of a 40 nm CMOS 18-bit Stereo Audio ΣΔ ADC

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https://hal.archives-ouvertes.fr/hal-01447789
Contributor : Haralampos Stratigopoulos <>
Submitted on : Friday, January 27, 2017 - 11:30:43 AM
Last modification on : Tuesday, July 23, 2019 - 4:22:19 PM

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Manuel Barragan, Rshdee Alhakim, Haralampos-G. Stratigopoulos, Matthieu Dubois, Salvador Mir, et al.. A Fully-Digital BIST Wrapper Based on Ternary Test Stimuli for the Dynamic Test of a 40 nm CMOS 18-bit Stereo Audio ΣΔ ADC. IEEE Transactions on Circuits and Systems I: Regular Papers, IEEE, 2016, ⟨10.1109/TCSI.2016.2602387⟩. ⟨hal-01447789⟩

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