Geant4 Analysis of n-Si Nuclear Reactions From Different Sources of Neutrons and Its Implication on Soft-Error Rate

S. Serre , S. Semikh , S. Uznanski , Jean-Luc Autran (1) , Daniela Munteanu (1) , G. Gasiot , P. Roche

1 IM2NP - Institut des Matériaux, de Microélectronique et des Nanosciences de Provence

This work examines nuclear events resulting from the interaction of atmospheric neutrons at ground level and different atmospheric-like sources with a silicon layer. Using extensive Geant4 simulations and in-depth data analysis, this study provides a detailed comparison between several facilities and natural environment in terms of nuclear processes, secondary ion production and fragment energy distribution. The different computed databases have been used in a second part of this work to estimate the Soft-Error Rate (SER) of a widely characterized 65 nm SRAM test circuit with the Tool suIte for rAdiation Reliability Assessment (TIARA Monte-Carlo simulation code). A detailed analysis is conducted to clarify the mechanisms leading to single and multiple cell upsets and to estimate the SER of a broad spectrum source from values obtained with monoenergetic simulations.

Domaines: Micro et nanotechnologies/Microélectronique

S. Serre, S. Semikh, S. Uznanski, Jean-Luc Autran, Daniela Munteanu, et al.. Geant4 Analysis of n-Si Nuclear Reactions From Different Sources of Neutrons and Its Implication on Soft-Error Rate. IEEE Transactions on Nuclear Science, 2012, 59 (4, 1), pp.714-722. ⟨10.1109/TNS.2012.2189018⟩. ⟨hal-01430091⟩