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Article Dans Une Revue Microelectronics Reliability Année : 2015

ASTEP (2005-2015): Ten years of soft error and atmospheric radiation characterization on the Plateau de Bure

S. Moindjie
  • Fonction : Auteur
T. Saad Saoud
  • Fonction : Auteur
S. Sauze
  • Fonction : Auteur
G. Gasiot
  • Fonction : Auteur
P. Roche
  • Fonction : Auteur

Résumé

This paper surveys ten years of experimentation conducted on the Altitude SEE (Single Event Effects) Test European Platform (ASTEP), a permanent mountain laboratory opened in 2005 on the Plateau de Bure (Devoluy, France) at the altitude of 2552 m and primarily dedicated to the characterization of soft errors in electronic circuits subjected to terrestrial cosmic rays. The paper retraces the foundations of the project and gives an extensive overview of the different past, current and future experiments conducted on ASTEP in the fields of SER (soft error rate) real-time testing and natural radiation monitoring and metrology. (C) 2015 Elsevier Ltd. All rights reserved.
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Dates et versions

hal-01430074 , version 1 (09-01-2017)

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Citer

Jean-Luc Autran, Daniela Munteanu, S. Moindjie, T. Saad Saoud, S. Sauze, et al.. ASTEP (2005-2015): Ten years of soft error and atmospheric radiation characterization on the Plateau de Bure. Microelectronics Reliability, 2015, 55 (9-10), pp.1506-1511. ⟨10.1016/j.microrel.2015.06.101⟩. ⟨hal-01430074⟩
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