 |
Conference papers
Predicting the risk of non-compliance to EMC requirements during the life-cycle
Abstract : This paper presents a simulation flow for the prediction of the long-term evolution of EMC levels during the lifetime of electronic devices or systems. This new requirement is essential to extend the warranty of critical applications operating in harsh environments. The simulation of the evolution of the electromagnetic emission of a switched-mode power supply is given as a validation case.
Cited literature [3 references]
https://hal.archives-ouvertes.fr/hal-01403875
Contributor : Alexandre Boyer <>
Submitted on : Monday, November 28, 2016 - 8:25:11 AM
Last modification on : Friday, January 10, 2020 - 9:10:14 PM
Document(s) archivé(s) le : Tuesday, March 21, 2017 - 7:08:11 AM
Contributor : Alexandre Boyer <>
Submitted on : Monday, November 28, 2016 - 8:25:11 AM
Last modification on : Friday, January 10, 2020 - 9:10:14 PM
Document(s) archivé(s) le : Tuesday, March 21, 2017 - 7:08:11 AM
File
PID4131123.pdf
Files produced by the author(s)
