Predicting the risk of non-compliance to EMC requirements during the life-cycle

Alexandre Boyer; He Huang; Sonia Ben Dhia

doi:10.1109/APEMC.2016.7522766

Predicting the risk of non-compliance to EMC requirements during the life-cycle

Alexandre Boyer ¹ He Huang ¹ Sonia Ben Dhia ¹

1 LAAS-ESE - Équipe Énergie et Systèmes Embarqués

LAAS - Laboratoire d'analyse et d'architecture des systèmes [Toulouse]

Abstract : This paper presents a simulation flow for the prediction of the long-term evolution of EMC levels during the lifetime of electronic devices or systems. This new requirement is essential to extend the warranty of critical applications operating in harsh environments. The simulation of the evolution of the electromagnetic emission of a switched-mode power supply is given as a validation case.

Type de document :

Communication dans un congrès

2016 Asia-Pacific International Symposium on Electromagnetic Compatibility and Signal Integrity (APEMC2016), May 2016, Shenzhen, China. pp.452 - 455, 2016, Electromagnetic Compatibility (APEMC), 2016 Asia-Pacific International Symposium on. 〈10.1109/APEMC.2016.7522766〉

Domaine :

Sciences de l'ingénieur [physics] / Electronique

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https://hal.archives-ouvertes.fr/hal-01403875
Contributeur : Alexandre Boyer <>
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