Identification of Resistivity Distributions in Dielectric Layers by Measurement Model Analysis of Impedance Spectroscopy

Yu-Min E Chen (1) , Anh E Nguyen (2) , Mark E. Orazem (1) , Bernard E Tribollet (3) , Nadine E Pébère (2) , Marco E Musiani (4) , Vincent Vivier (3)

1 UF|CHE - Department of Chemical Engineering [Gainesville]
2 CIRIMAT - Centre interuniversitaire de recherche et d'ingenierie des matériaux
3 LISE - Laboratoire Interfaces et Systèmes Electrochimiques
4 CNR - Instituto per l'Energetica e le Interfasi

The Voigt measurement model, developed in the 1990s for identification of the error structure of impedance measurements, is shown here to have utility in identifying resistivity distributions that give rise to frequency dispersion. The analysis was validated by application to synthetic data derived from a constant–phase–element model, a power–law distribution of resistivity, and an exponential distribution corresponding to a Young impedance. The application to experimental data obtained from coated aluminum demonstrates its utility for interpretation of impedance measurements.

Mots clés: organic coatings; Young impedance; power–law model; Constant–Phase Elements (CPE); passive oxides

Domaines: Chimie; Autre

Yu-Min E Chen, Anh E Nguyen, Mark E. Orazem, Bernard E Tribollet, Nadine E Pébère, et al.. Identification of Resistivity Distributions in Dielectric Layers by Measurement Model Analysis of Impedance Spectroscopy. Electrochimica Acta, 2016, 219, pp.312 - 320. ⟨10.1016/j.electacta.2016.09.136⟩. ⟨hal-01402075⟩