Elaboration of a new pulsed laser system for SEE testing

V. Pouget (1) , T. Calin (2) , H. Lapuyade (1) , D. Lewis (1) , P. Fouillat (1) , Raoul Velazco (2) , Y. Maidon (1) , L. Sarger (3)

1 IMS - Laboratoire de l'intégration, du matériau au système
2 TIMA - Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés
3 CPMOH - Centre de physique moléculaire optique et hertzienne

This paper presents the elaboration of a new on-line single event effects testing facility based on a pulsed laser. Experimental choices and capabilities are detailed. Preliminary results confirm that the pulsed laser technique is a powerful complement for irradiation testing.

Domaines: Micro et nanotechnologies/Microélectronique

V. Pouget, T. Calin, H. Lapuyade, D. Lewis, P. Fouillat, et al.. Elaboration of a new pulsed laser system for SEE testing. IEEE International On-Line Testing Workshop (IOLTW'98), Jul 1998, Capri, Italy. ⟨hal-01384704⟩