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Communication Dans Un Congrès Année : 2000

Synthesis of a 8051-like microcontroller tolerant to transient faults

Résumé

This paper presents fault-detection and correction techniques used to obtain a version of the 8051 microcontroller, so that it becomes robust with respect to a particular fault type: the transient modification of memory cells contents, so-called upsets or bitfits. A specific study regarding these issues was developed in an 8051 VHDL description synthesized in a FPGA environment. Preliminary results of a fault injection experiment are presented to validate the approach.
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Dates et versions

hal-01384230 , version 1 (19-10-2016)

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Paternité - Pas d'utilisation commerciale

Identifiants

  • HAL Id : hal-01384230 , version 1

Citer

E.F. Cota, L. Carro, Marcelo Lubaszewski, Raoul Velazco, S. Rezgui. Synthesis of a 8051-like microcontroller tolerant to transient faults. 1st IEEE Latin-American Test Workshop (LATW'00), Mar 2000, Rio de Janeiro, Brazil. ⟨hal-01384230⟩

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