Simulating single event transients in DVSM ICs for ground level radiation
Résumé
This work considers a tool for simulating single event transients produced by ground level radiation in VDSM ICs. Fault injection procedures and a fast fault simulation algorithm for transient faults were implemented around an event driven simulator. A statistical analysis was implemented to organize data sampled from simulations. The performance evaluation of the algorithm shows that for a large number of fault injections, the algorithm is much faster than a serial fault simulation approach.
