Implementation and evaluation of a soft error detecting technique
Résumé
In this work we caution that future nanometer circuits will contain undetected timing errors and also will be subject of very high soft-error rates. Thus, fault tolerant techniques will become necessary even for commodity applications. This work considers the implementation of a new soft error and timing error detecting technique based on time redundancy. The obtained results show that detection of such temporal faults can be achieved by means of meaningful hardware and performance cost.
