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Article Dans Une Revue IEEE Design & Test Année : 1999

A D&T Roundtable: On-Line Test

Résumé

Online testing has been a known field for sometime now. However, to- day’s situation with online testing may be a little bit different than it was in the past. With the nanometer technologies, we may see more soft errors that cause problems. The goal of this roundtable is to analyze where on- line test was and where future technologies are going. D&T thanks participants Jacob A. Abraham (Univ. of Texas at Austin), Miron Abramovici (Bell Labs), Silvano Motto (CAEN Microeletronica), Isaac Levendel (Motorola), and Michael Nicolaidis (TIMA). Our moderator was Yervant Zorian (LogicVision). Also attending were Lorena Anghel (TIMA) and Fabian Vargas (Puers, Brazil). D&T Roundtable Editor Kaushik Roy (Purdue Univ.) organized the event. The roundtable was held at the Fourth IEEE International On-Line Testing Workshop in July 1998. D&T thanks the workshop for hosting it.
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hal-01333493 , version 1 (17-06-2016)

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Paternité - Pas d'utilisation commerciale

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  • HAL Id : hal-01333493 , version 1

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I. Levendel, M. Nicolaidis, J. Abraham, M. Abramovici, S. Motto. A D&T Roundtable: On-Line Test. IEEE Design & Test, 1999, 16 (1), pp.80-86. ⟨hal-01333493⟩

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