Relationship between Residual Stresses and Damaging in Thermally Grown Oxide on Metals: Raman Spectroscopy and Synchrotron Micro-Diffraction Contributions - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue Advances in Science and Technology Année : 2014

Relationship between Residual Stresses and Damaging in Thermally Grown Oxide on Metals: Raman Spectroscopy and Synchrotron Micro-Diffraction Contributions

Résumé

Ni-30Cr and Fe-47Cr alloys have been oxidized at 900 and 1000°C in air. The influence of the oxidation and cooling conditions on the magnitude of residual stresses present in the oxide scale as well as the existing relaxation modes are studied. A rigorous determination of the residual stresses at both macroscopic scale in the oxide film adherent to the substrate and local scale over the damaged areas allows a comparison with models describing thin film delamination. A multi-scale approach is then proposed: Residual stress levels are determined thanks to conventional x-ray diffraction and Raman spectroscopy while mappings are done over different types of buckling using Raman micro-spectroscopy and synchrotron micro-diffraction. Additional morphological information combined to associated stress levels is injected in the mechanical laws for buckling in order to extract the interfacial toughness.
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hal-01293577 , version 1 (25-03-2016)

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Jean-Luc Grosseau-Poussard, Mathieu Guerain, Philippe Goudeau, Guillaume Geandier, Benoît Panicaud, et al.. Relationship between Residual Stresses and Damaging in Thermally Grown Oxide on Metals: Raman Spectroscopy and Synchrotron Micro-Diffraction Contributions. Advances in Science and Technology, 2014, 91 (1), pp.100-107. ⟨10.4028/www.scientific.net/AST.91.100⟩. ⟨hal-01293577⟩
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