Influence of annealing on the structural and magnetic properties of epitaxial Zn1–xMnxO films grown by MOCVD on sapphire

E. Chikoidze (1) , Jurgen von Bardeleben (2) , Y. Dumont , F. Jomard (3, 4) , O. Gorochov

1 LPSC - Laboratoire de physique des solides et de cristallogénèse
2 INSP - Institut des Nanosciences de Paris
3 LMOPS - Laboratoire Matériaux Optiques, Photonique et Systèmes
4 LETAM - Laboratoire d'étude des textures et application aux matériaux

Thermal annealing of MOCVD grown Zn1–xMnxO layers between 300 °C and 1000 °C in an oxygen atmosphere modifies both their latttice parameters and their magnetic properties. Combined X-ray diffraction and EPR studies indicate a redistribution of intrinsic defects but persistent antiferromagnetic phase in the annealed films. (© 2006 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)

Mots clés: 68.55.Jk; 75.50.Ee; 75.50.Pp; 76.30.Lh; 81.40.Ef

Domaines: Matière Condensée [cond-mat]

E. Chikoidze, Jurgen von Bardeleben, Y. Dumont, F. Jomard, O. Gorochov. Influence of annealing on the structural and magnetic properties of epitaxial Zn1–xMnxO films grown by MOCVD on sapphire. physica status solidi (c), 2006, 3 (4), pp.1001--1004. ⟨10.1002/pssc.200564651⟩. ⟨hal-01288818⟩