Thickness Dependence of the Properties of Epitaxial Barium Strontium Titanate Thin Films

V.-B. Shirokov (1, 2) , Yu I. Golovko (2) , V.M. Mukhortov (2, 1) , Yu. I. Yuzyuk (1) , P.-E Janolin (3) , B. Dkhil (3)

1 SFEDU - Southern Federal University [Rostov-on-Don]
2 Southern Scientific Center
3 SPMS - Laboratoire Structures, Propriétés et Modélisation des solides

Heteroepitaxial Ba (x) Sr1 - x TiO3 thin films of different thicknesses have been studied in the paraelectric phase at a temperature of 600A degrees C. The lattice parameters of the film have nonlinear dependence on the thickness. The misfit strain and unit cell volume increase with decreasing thickness. The behavior of the misfit strain with variations in the thickness is well described in the model of the double electric layer formed during the synthesis of the film at the interface with the substrate.

Domaines: Science des matériaux [cond-mat.mtrl-sci]

V.-B. Shirokov, Yu I. Golovko, V.M. Mukhortov, Yu. I. Yuzyuk, P.-E Janolin, et al.. Thickness Dependence of the Properties of Epitaxial Barium Strontium Titanate Thin Films. Physics of the Solid State, 2015, 57 (8), pp.1529-1534. ⟨10.1134/S1063783415080314⟩. ⟨hal-01259825⟩