Overview on sustainability, robustness and reliability of GaN single chip LED devices

Yannick Deshayes (1) , Raphael Baillot (1) , Simon Joly , Yves Ousten (1) , Laurent Béchou (1)

1 IMS - Laboratoire de l'intégration, du matériau au système

Domaines: Sciences de l'ingénieur [physics]; Optique / photonique

Yannick Deshayes, Raphael Baillot, Simon Joly, Yves Ousten, Laurent Béchou. Overview on sustainability, robustness and reliability of GaN single chip LED devices. IEEE Transactions on Device and Materials Reliability, 2015, ⟨10.1109/TDMR.2015.2488978⟩. ⟨hal-01221533⟩