High Level Modeling of Signal Integrity in High Frequency USB 3.0 Systems with SystemC-AMS

Ruomin Wang 1 Julien Denoulet 1 Sylvain Feruglio 1 Farouk Vallette 1 Patrick Garda 1
1 SYEL - Systèmes Electroniques
LIP6 - Laboratoire d'Informatique de Paris 6
Document type :
Conference papers
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https://hal.archives-ouvertes.fr/hal-01217525
Contributor : Lip6 Publications <>
Submitted on : Monday, October 19, 2015 - 4:50:56 PM
Last modification on : Thursday, March 21, 2019 - 2:33:11 PM

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  • HAL Id : hal-01217525, version 1

Citation

Ruomin Wang, Julien Denoulet, Sylvain Feruglio, Farouk Vallette, Patrick Garda. High Level Modeling of Signal Integrity in High Frequency USB 3.0 Systems with SystemC-AMS. Colloque du GDR Systemes materiels-logiciels integres, Jun 2013, Lyon, France. ⟨hal-01217525⟩

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