Optical Characteristics of Synchrotron Sources and Their Influence in the Simulation of X-Ray Topographs

Yves Epelboin (1) , Vito Mocella (2) , Alain Soyer (1)

1 LMCP - Laboratoire de minéralogie, cristallographie de Paris
2 IMM - Instituto per la Microelectronica e Microsistemi [Napoli]

The optical characteristics of third-generation synchrotron sources and their influence on the simulation of X-ray topographs for various experimental settings, both for the Laue and Bragg case, are discussed. A new generation of simulation programs that allow easy modification of the model of deformation is described.

Mots clés: Synchrotron Radiation; X-ray topography; Simulation

Domaines: Science des matériaux [cond-mat.mtrl-sci]

Yves Epelboin, Vito Mocella, Alain Soyer. Optical Characteristics of Synchrotron Sources and Their Influence in the Simulation of X-Ray Topographs . Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences, 1999, 357 (1761), pp.2731-2739. ⟨hal-01215125⟩