Correlation between forward-reverse low-frequency noise and atypical I–V signatures in 980 nm high-power laser diodes

Abstract : Highlights • We observe atypical laser diode (LD) signatures in reverse I-V measurement identified as microplasma discharges. • Correlation between reverse I-V signatures and LFN measurements appears as a complementary tool for improvement of screening methodology for LD. • Reverse and forward noise spectra especially exhibit 1/f noise. • Some lasers reveal g-r noise component in bias voltages corresponding to reverse I-V slope changes and around ITH. • Presence of g-r noise leads to believe that point defect can be localized near the active zone.
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Journal articles
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https://hal.archives-ouvertes.fr/hal-01214031
Contributor : Yannick Deshayes <>
Submitted on : Friday, October 9, 2015 - 3:54:57 PM
Last modification on : Thursday, January 11, 2018 - 6:21:09 AM

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Pamela del Vecchio, Arnaud Curutchet, Yannick Deshayes, Mauro Bettiati, François Laruelle, et al.. Correlation between forward-reverse low-frequency noise and atypical I–V signatures in 980 nm high-power laser diodes. Microelectronics Reliability, Elsevier, 2015, 55 (9-10), pp.1741-1745. ⟨10.1016/j.microrel.2015.06.041⟩. ⟨hal-01214031⟩

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